Patent Assignment
Reel/Frame 021876/0706
Security Interest
Recorded: 2008-11-19
Received: 2008-11-21
Pages: 21
Assignor
REVERA INCORPORATED
Executed: 2008-08-20
Assignee
VENTURE LENDING & LEASING V, INC.
2010 NORTH FIRST STREET, SAN JOSE, CA, 95131, UNITED STATES
Covered Properties
(10)
Method and System for Calibrating an X-Ray Photoelectron Spectroscopy Measurement
Application:
61/048,811 →
Calibrating Multiple Photoelectron Spectroscopy Systems
Application:
11/395,189 →
Diamond Anode
Application:
11/228,685 →
Method and system for non-destructive distribution profiling of an element in a film
Application:
60/698,367 →
Determining Layer Thickness Using Photoelectron Spectroscopy
Application:
11/118,035 →
Semiconductor Substrate Processing Method and Apparatus
Application:
11/040,329 →
Electronic Device Incorporating a Multilayered Capacitor Formed on a Printed Circuit Board
Application:
11/023,271 →
System and Method for Depth Profiling and Characterization of Thin Films
Application:
10/493,492 →
Nondestructive Characterization of Thin Films Based on Acquired Spectrum
Application:
10/330,317 →
Nondestructive Characterization of Thin Films Using Measured Basis Spectra
Application:
10/330,383 →