IP Library Assignment 021979/0627
Patent Assignment
Reel/Frame 021979/0627

Assignment of Assignor's Interest

Recorded: 2008-12-15 Pages: 2
Assignors
KASUKABE, SUSUMU
Executed: 2008-10-30
NARIZUKA, YASUNORI
Executed: 2008-10-30
Assignee
RENESAS TECHNOLOGY CORP.
6-2, OTE-MACHI 2-CHOME, CHIYODA-KU, TOKYO, JAPAN
Covered Property (1)
Probe Card, Manufacturing Method of Probe Card, Semiconductor Inspection Apparatus and Manufacturing Method of Semiconductor Device
Patent: 7,724,006 →
Application: 12/253,271 →
Publication: US 2009/0212798
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Merger and Change of Name Sep 9, 2010
From: RENESAS TECHNOLOGY CORP.
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024953/0672 →