Patent Assignment
Reel/Frame 022049/0399
Assignment of Assignor's Interest
Recorded: 2008-12-19
Pages: 3
Assignors
KIM, BUM-KEUN
Executed: 2008-11-25
KIM, KYUNG-YOUNG
Executed: 2008-11-25
OH, JUNG-HWAN
Executed: 2008-11-25
LEE, BEOM-SEOK
Executed: 2008-11-25
Assignee
SAMSUNG ELECTRONICS CO., LTD.
416, MAETAN-DONG, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF
Covered Property
(1)
Memory Test Device and Memory Test Method