IP Library › Assignment 022198/0947
Patent Assignment
Reel/Frame 022198/0947

Assignment of Assignor's Interest

Recorded: 2009-02-03 Pages: 2
Assignors
KOIZUMI, DAISUKE
Executed: 2009-01-13
KOHASHI, NAOHITO
Executed: 2009-01-13
AKASAKI, YUJI
Executed: 2009-01-13
Assignee
FUJITSU MICROELECTRONICS LIMITED
7-1, NISHI-SHINJUKU 2-CHOME, SHINJUKU-KU,, TOKYO, 163-0722, JAPAN
Covered Property (1)
Component for Testing Device for Electronic Component and Testing Method of the Electronic Component
Patent: 7,977,961 →
Application: 12/358,522 →
Publication: US 2009/0302876
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jul 9, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024651/0744 →
Assignment of Assignor's Interest Apr 27, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035508/0637 →