Assignment of Assignor's Interest

Recorded: 2009-02-06 Pages: 2

Assignor

MATSUMIYA, YASUO

Executed: 2009-01-05

Assignee

FUJITSU MICROELECTRONICS LIMITED

7-1, NISHI-SHINJUKU 2-CHOME, SHINJUKU-KU, TOKYO, 163-0722, JAPAN

Covered Property (1)

Defect Inspection Method and Defect Inspection Apparatus

Application: 12/367,444 →

Publication: US 2009/0196490

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.