Assignment of Assignor's Interest

Recorded: 2009-05-18 Pages: 2

Assignor

KOBAYASHI, TOMOHIRO

Executed: 2009-04-27

Assignee

FUJITSU LIMITED

1-1 KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA, 211-8588, JAPAN

Covered Property (1)

Abnormality Detection Method for Electronic Device Connected by Loop, and Electronic Device

Application: 12/467,791 →

Publication: US 2010/0058111

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.