Patent Assignment
Reel/Frame 022733/0032
Assignment of Assignor's Interest
Recorded: 2009-05-15
Pages: 4
Assignor
KOJIMA, HIROMI
Executed: 2009-05-15
Assignee
KAWASAKI MICROELECTRONICS, INC.
MAKUHARI TECHNO GARDEN B5, 1-3, NAKASE, MIHAMA-KU, CHIBA 261-8501, JAPAN
Covered Property
(1)
Method of Generating Test Condition for Detecting Delay Faults in Semiconductor Integrated Circuit and Apparatus for Generating the Same
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.