Patent Assignment
Reel/Frame 022746/0870
Partial Release of Security Interest
Recorded: 2009-05-30
Received: 2009-05-30
Pages: 93
Assignor
U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL TRUSTEE
Executed: 2009-05-27
Assignee
MAGNACHIP SEMICONDUCTOR, LTD.
1, HYANGIEONG-DONG, HUNGDUK-GU, CHEONGJU-SI, CHUNGBUK, KRX, KOREA, REPUBLIC OF
Covered Properties
(39)
Backside Illuminated Image Sensor
Application:
12/216,065 →
Cmos Image Sensor with Backside Illumination and Method for Manufacturing the Same
Application:
11/646,236 →
Domain Name Acquisition and Management System and Method
Application:
11/377,792 →
Hardware and Clutch Mechanism for Window Treatment
Application:
10/809,314 →
Method of Forming a Photodiode for an Image Sensor
Application:
10/447,376 →
Cmos Image Sensor Capable of Increasing Punch-Through Voltage and Charge Integration of Photodiode, and Method for Forming the Same
Application:
10/391,798 →
Semi-Cordless Unbalanced Spring Driven Blind System and Methods for Adjusting and Making Same
Application:
10/393,792 →
Roller Shade Clutch with Internal Gearing
Application:
10/393,797 →
Universal Brackets for Roller Shade
Application:
10/392,021 →
Universal Bracketing and Cap System for Multiple Cassette Roller Shade
Application:
10/391,003 →
Mono Control Lift and Tilt Mechanism for Horizontal Blinds
Application:
10/389,837 →
Method of Fabricating Image Sensor Equipped with Lens
Application:
10/365,987 →
Cmos Image Sensor and Method for Fabricating the Same
Application:
10/334,065 →
Image Sensor Having Photodiode on Substrate
Application:
10/330,273 →
Method for Fabricating Image Sensor Using Salicide Process
Application:
10/318,072 →
Tab Release Cord Tension Device
Application:
10/292,029 →
Photodiode Having a Plurality of Pn Injections and Image Sensor Having the Same
Application:
10/272,842 →
Inductor and Fabricating Method Thereof
Application:
10/259,878 →
Cmos Image Sensor Capable of Increasing Fill Factor and Driving Method Thereof
Application:
10/205,696 →
Cmos Image Sensor
Application:
10/197,491 →
Circuit for Preventing System Malfunction in Semiconductor Memory and Method Thereof
Application:
10/152,624 →
Cmos Image Sensor and a Fabrication Method for the Same
Application:
10/152,043 →
Method for Cleaning the Contact Area of a Metal Line
Application:
10/119,809 →
Color Image Sensor and Method for Fabricating the Same
Application:
10/091,409 →
Micro Controller Development System
Application:
10/043,291 →
Cmos Image Sensor Having a Chopper-Type Comparator to Perform Analog Correlated Double Sampling
Application:
10/016,951 →
Cmos Image Sensor Having Enhanced Photosensitivity and Method for Fabricating the Same
Application:
09/995,215 →
Metal Layer in Semiconductor Device Including a Planar Stuffed Layer and an Insulating Film with a Projection
Application:
09/987,743 →
Semiconductor Device Fabricated on Multiple Substrates and Method for Fabricating the Same
Application:
09/977,249 →
Cmos Image Sensor Capable of Increasing Punch-Through Voltage and Charge Integration of Photodiode
Application:
09/973,946 →
Method of Forming a Photodiode for an Image Sensor
Application:
09/964,156 →
Image Sensor and Method for Fabricating the Same
Application:
09/941,481 →
Cmos Image Sensor and Method for Fabricating the Same
Application:
09/931,119 →
Cmos Image Sensor and Method for Fabricating the Same
Application:
09/891,212 →
Solid State Ccd Image Sensor Having a Light Shielding Layer
Application:
09/879,061 →
Mosfet and Fabrication Method Thereof
Application:
09/871,711 →
Solid State Image Sensor Device and Method of Fabricating the Same
Application:
09/809,284 →
Low Power Audio Processor That Multiplexes Component Distribution Signals
Application:
09/805,963 →
Image Sensor with Analog-to-Digital Converter That Generates a Variable Slope Ramp Signal
Application:
09/780,944 →