IP Library Assignment 022796/0463
Patent Assignment
Reel/Frame 022796/0463

Assignment of Assignor's Interest

Recorded: 2009-05-27 Pages: 4
Assignors
NOSE, TAKASHI
Executed: 2009-05-15
FURIHATA, HIROBUMI
Executed: 2009-05-15
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property (1)
Integrated Circuit Design Method for Improved Testability
Patent: 8,279,230 →
Application: 12/453,930 →
Publication: US 2009/0295813
Related Assignments (7)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Oct 26, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025193/0174 →
Assignment of Assignor's Interest Sep 19, 2014
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS SP DRIVERS INC.
Reel/Frame 033778/0137 →
Change of Name May 29, 2015
From: RENESAS SP DRIVERS INC.
To: SYNAPTICS DISPLAY DEVICES KK
Reel/Frame 035796/0947 →
Change of Name May 29, 2015
From: SYNAPTICS DISPLAY DEVICES KK
To: SYNAPTICS DISPLAY DEVICES GK
Reel/Frame 035797/0036 →
Change of Name Aug 8, 2016
From: SYNAPTICS DISPLAY DEVICES GK
To: SYNAPTICS JAPAN GK
Reel/Frame 039711/0862 →
Security Interest Sep 27, 2017
From: SYNAPTICS INCORPORATED
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 044037/0896 →
Assignment of Assignor's Interest Jun 20, 2024
From: SYNAPTICS JAPAN GK
To: SYNAPTICS INCORPORATED
Reel/Frame 067793/0211 →