IP Library › Assignment 022950/0095
Patent Assignment
Reel/Frame 022950/0095

Assignment of Assignor's Interest

Recorded: 2009-07-14 Pages: 4
Assignors
MARUYAMA, YUJI
Executed: 2009-06-04
TASHIRO, KAZUHIRO
Executed: 2009-06-04
SHIMABAYASHI, KAZUHIKO
Executed: 2009-06-04
GOTO, SHIGERU
Executed: 2009-06-04
NAKASHIRO, TAKAYUKI
Executed: 2009-06-04
KOSHINUMA, SUSUMU
Executed: 2009-06-04
SHIRAKAWA, MASAYOSHI
Executed: 2009-06-04
Assignee
FUJITSU MICROELECTRONICS LIMITED
7-1, NISHI-SHINJUKU 2-CHOME, SHINJUKU-KU,, TOKYO, 163-0722, JAPAN
Covered Property (1)
Testing Device for Testing a Semiconductor Device
Patent: 8,159,250 →
Application: 12/500,895 →
Publication: US 2009/0267630
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jul 9, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024651/0744 →
Assignment of Assignor's Interest Apr 27, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035508/0637 →