Patent Assignment
Reel/Frame 023469/0946
Assignment of Assignor's Interest
Recorded: 2009-11-04
Pages: 2
Assignor
NAKAMURA, HIDEAKI
Executed: 2009-10-16
Assignee
FUJITSU MICROELECTRONICS LIMITED
7-1, NISHI-SHINJUKU 2-CHOME, SHINJUKU-KU,, TOKYO, 163-0722, JAPAN
Covered Property
(1)
Testing Device and Testing Method of Semiconductor Devices
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.