Patent Assignment
Reel/Frame 023493/0504
Assignment of Assignor's Interest
Recorded: 2009-11-10
Pages: 2
Assignor
TAKAHASHI, NAOHIRO
Executed: 2009-10-14
Assignee
FUJITSU MICROELECTRONICS LIMITED
7-1, NISHI-SHINJUKU 2-CHOME, SHINJUKU-KU, TOKYO, 163-0722, JAPAN
Covered Property
(1)
Defect Review Apparatus and Method for Wafer
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.