Assignment of Assignor's Interest

Recorded: 2009-12-21 Pages: 3

Assignors

YAMAGUCHI, NORIHIKO

Executed: 2009-10-23

TANIGUCHI, SATOSHI

Executed: 2009-10-21

IKEDA, MASAO

Executed: 2009-10-21

Assignee

SONY CORPORATION

1-7-1 KONAN, MINATO-KU, TOKYO, JAPAN

Covered Property (1)

Nondestructive Testing Method for Oxide Semiconductor Layer and Method for Making Oxide Semiconductor Layer

Patent: 8,080,434 →

Application: 12/622,095 →

Publication: US 2010/0129942

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.