IP Library Assignment 024157/0625
Patent Assignment
Reel/Frame 024157/0625

Assignment of Assignor's Interest

Recorded: 2010-03-19 Pages: 2
Assignors
FUKUNAGA, MASAYASU
Executed: 2010-03-09
KONISHI, HIDEAKI
Executed: 2010-03-09
Assignee
FUJITSU MICROELECTRONICS LIMITED
2-10-23 SHIN-YOKOHAMA,, KOHOKU-KU, YOKOHAMA-SHI, KANAGAWA 222-0033, JAPAN
Covered Property (1)
Semiconductor Integrated Circuit and Method for Testing the Same
Patent: 7,872,490 →
Application: 12/659,760 →
Publication: US 2010/0213970
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Feb 25, 2015
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 035089/0853 →
Assignment of Assignor's Interest Apr 27, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035508/0637 →