IP Library › Assignment 024224/0781
Patent Assignment
Reel/Frame 024224/0781

Assignment of Assignor's Interest

Recorded: 2010-04-13 Pages: 5
Assignors
URBAN, ALEXANDER
Executed: 2010-02-11
SCHAEFFLER, PETER
Executed: 2010-02-11
PFEIFFER, ANDREAS
Executed: 2010-02-11
SCHWEKENDIEK, HOLGER
Executed: 2010-02-11
Assignee
TEXAS INSTRUMENTS DEUTSCHLAND GMBH
HAGGERTYSTRASSE 1, FREISING, 85356, GERMANY
Covered Property (1)
Apparatus and Method for Detecting Defects in Wafer Manufacturing
Patent: 8,532,364 →
Application: 12/704,383 →
Publication: US 2010/0208980
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Feb 16, 2021
From: TEXAS INSTRUMENTS DEUTSCHLAND GMBH
To: TEXAS INSTRUMENTS INCORPORATED
Reel/Frame 055314/0255 →