IP Library › Assignment 024278/0302
Patent Assignment
Reel/Frame 024278/0302

Assignment of Assignor's Interest

Recorded: 2010-04-23 Received: 2010-04-23 Pages: 26
Assignor
Assignee
CAMECA INSTRUMENTS, INC.
91 MCKEE DRIVE, MAHWAH, NJ, 07430, UNITED STATES
Covered Properties (22)
Methods and Apparatuses to Align Energy Beam to Atom Probe Specimen
Application: 12/676,314 →
Laser Atom Probes
Application: 11/720,709 →
Methods and Devices to Improve Particle Detector Performance
Application: 61/316,184 →
Laser Atom Probe Methods
Application: 12/692,394 →
Atom Probe
Application: 11/917,663 →
Reflectron
Application: 12/425,291 →
Atom Probe Data Processes and Associated Systems
Application: 12/296,700 →
Methods and Devices for Atom Probe Mass Resolution Enhancement
Application: 11/629,414 →
Atom Probe Pulse Energy
Application: 12/092,066 →
Atom Probe Data and Associated Systems and Methods
Application: 12/294,716 →
Atom Probe Component Treatments
Application: 11/917,672 →
Atom Probes, Atom Probe Specimens, and Associated Methods
Application: 12/064,020 →
Atom Probe Electrode Treatments
Application: 11/917,685 →
Specimens for Microanalysis Processes
Application: 11/997,141 →
Atom Probe Evaporation Processes
Application: 11/997,145 →
Laser Atom Probe Methods
Application: 11/597,080 →
Laser Atom Probe
Application: 10/592,661 →
High Resolution Atom Probe
Application: 10/559,733 →
Methods of Sampling Specimens for Microanalysis
Application: 10/428,372 →
Vacuum Chamber with Recessed Viewing Tube and Imaging Device Situated Therein
Application: 10/419,035 →
Delay Line Anodes
Application: 09/888,940 →
Methods of Sampling Specimens for Microanalysis
Application: 09/861,405 →