IP Library Assignment 024791/0097
Patent Assignment
Reel/Frame 024791/0097

Assignment of Assignor's Interest

Recorded: 2010-08-04 Pages: 3
Assignor
DEN BOEF, ARIE JEFFREY
Executed: 2008-03-27
Assignee
ASML NETHERLANDS B.V.
DE RUN 6501, VELDHOVEN, NL - 5504 DR, NETHERLANDS
Covered Property (1)
Diffraction Based Overlay Metrology Tool and Method
Patent: 8,339,595 →
Application: 12/747,795 →
Publication: US 2010/0328655