Patent Assignment
Reel/Frame 024966/0456
Assignment of Assignor's Interest
Recorded: 2010-09-10
Pages: 2
Assignors
WATANABE, MASAHIRO
Executed: 2010-06-24
BABA, SHUICHI
Executed: 2010-06-29
NAKATA, TOSHIHIKO
Executed: 2010-06-25
Assignee
HITACHI, LTD.
6-6, MARUNOUCHI 1-CHOME, CHIYODA-KU, TOKYO, JAPAN
Covered Property
(1)
Scanning Probe Microscope and a Measuring Method Using the Same