Patent Assignment
Reel/Frame 025573/0591
Assignment of Assignor's Interest
Recorded: 2010-12-30
Pages: 2
Assignee
HYNIX SEMICONDUCTOR INC.
SAN 136-1, AMI-RI, BUBAL-EUP, ICHEON-SI, GYEONGGI-DO, 467-701, KOREA, REPUBLIC OF
Covered Property
(1)
Semiconductor Memory Device, Test Circuit, and Test Operation Method Thereof