IP Library Assignment 025677/0179
Patent Assignment
Reel/Frame 025677/0179

Assignment of Assignor's Interest

Recorded: 2011-01-19 Pages: 2
Assignors
SHIN, JOUNGHEE
Executed: 2010-12-21
CHANG, SUNGHO
Executed: 2010-12-21
PARK, BYEONGDAE
Executed: 2010-12-21
Assignee
SAMSUNG ELECTRONICS CO., LTD.
416 MAETAN-DONG, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF
Covered Property (1)
Universal Frame for Testing Semiconductor Device
Patent: 8,251,729 →
Application: 13/009,076 →
Publication: US 2011/0176864