IP Library › Assignment 026489/0320
Patent Assignment
Reel/Frame 026489/0320

Assignment of Assignor's Interest

Recorded: 2011-06-23 Pages: 10
Assignor
Assignee
OXFORD INTRUMENTS SUPERCONDUCTIVITY LIMITED
TUBNEY WOODS, ABINGDON, OXON, OX13 5QX, UNITED KINGDOM
Covered Properties (5)
Apparatus for Analysing a Sample
Patent: 6,487,269 →
Application: 09/984,654 →
Publication: US 2002/0054661
Detection System
Patent: 6,573,509 →
Application: 10/078,539 →
Publication: US 2002/0117628
Method of Analysing Crystalline Texture
Patent: 6,748,345 →
Application: 10/200,251 →
Publication: US 2003/0130803
Electron Detection Device
Patent: 6,670,615 →
Application: 10/245,545 →
Publication: US 2003/0057377
Sample Inspection Apparatus
Patent: 7,151,269 →
Application: 11/125,317 →
Publication: US 2006/0255290
Related Assignments (13)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Aug 16, 1999
From: ALFORD, WILLIAM J.; SMITH, ARLEE V.
To: SANDIA CORPORATION
Reel/Frame 010170/0647 →
Assignment of Assignor's Interest Dec 5, 2001
From: ANDERSON, ROBIN JOHN
To: OXFORD INSTRUMENTS ANALYTICAL LIMITED
Reel/Frame 012342/0065 →
Assignment of Assignor's Interest Mar 15, 2002
From: RADLEY, IAN; TYRRELL, CHRISTOPHER
To: OXFORD INSTRUMENTS ANALYTICAL LIMITED
Reel/Frame 012685/0787 →
Corrective Assignment to Add Omitted Inventor's Name, Previously Recorded on Reel 012685 Frame 0787, Assignor Hereby Confirms the Assignment of the Entire Interest. Jun 10, 2002
From: RADLEY, IAN; BHADARE, SANTOKH SINGH; TYRRELL, CHRISTOPHER
To: OXFORD INSTRUMENTS ANALYTICAL LIMITED
Reel/Frame 012977/0572 →
Assignment of Assignor's Interest Jul 23, 2002
From: CHOU, CHENG TSIEN; DICKS, KEITH GRAHAM; ROLLAND, PIERRE
To: OXFORD INSTRUMENTS ANALYTICAL LIMITED
Reel/Frame 013134/0419 →
Assignment of Assignor's Interest Sep 18, 2002
From: GILMORE, WILLIAM H.; DICKS, KEITH GRAHAM
To: OXFORD INSTRUMENTS ANALYTICAL LIMITED
Reel/Frame 013303/0027 →
Assignment of Assignor's Interest Oct 6, 2003
From: GILMORE, WILLIAM H.; DICKS, KEITH GRAHAM
To: OXFORD INSTRUMENTS ANALYTICAL LIMITED
Reel/Frame 014576/0888 →
Corrective Assignment to Correct the Assignor's Execution Date, Previously Recorded on Reel 014576 Frame 0888. May 25, 2004
From: GILMORE, WILLIAM H.; DICKS, KEITH GRAHAM
To: OXFORD INSTRUMENTS ANALYTICAL LIMITED
Reel/Frame 015366/0220 →
Assignment of Assignor's Interest Jul 22, 2005
From: BHADARE, SANTOKH SINGH; BARKSHIRE, IAN RICHARD; TURNER, DANIEL FRANK
To: OXFORD INSTRUMENTS ANALYTICAL LIMITED
Reel/Frame 016808/0059 →
Change of Name Jul 12, 2011
From: OXFORD INSTRUMENTS SUPERCONDUCTIVITY LIMITED
To: OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Reel/Frame 026578/0708 →
Assignment of Assignor's Interest Mar 1, 2017
From: OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
To: OXFORD INSTRUMENTS INDUSTRIAL PRODUCTS LIMITED
Reel/Frame 041420/0896 →
Assignment of Assignor's Interest Jul 31, 2017
From: OXFORD INSTRUMENTS INDUSTRIAL PRODUCTS LIMITED
To: MATERIALS ANALYSIS LIMITED
Reel/Frame 043144/0361 →
Change of Name Sep 25, 2017
From: MATERIALS ANALYSIS LIMITED
To: HITACHI HIGH-TECH ANALYTICAL SCIENCE LIMITED
Reel/Frame 043681/0570 →