Patent Assignment
Reel/Frame 026655/0498
Assignment of Assignor's Interest
Recorded: 2011-07-27
Pages: 2
Assignors
NAKAO, TOSHIYUKI
Executed: 2011-07-10
MARUYAMA, SHIGENOBU
Executed: 2011-07-10
HAMAMATSU, AKIRA
Executed: 2011-07-14
URANO, YUTA
Executed: 2011-07-14
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU,, TOKYO, JAPAN
Covered Property
(1)
Defect Inspecting Method and Defect Inspecting Apparatus