Patent Assignment
Reel/Frame 026767/0422
Assignment of Assignor's Interest
Recorded: 2011-08-17
Pages: 5
Assignors
HU, JIA-RUI
Executed: 2011-06-02
HUANG, TE-CHIH
Executed: 2011-06-02
KE, CHIH-MING
Executed: 2011-06-02
LIN, HUA-TAI
Executed: 2011-06-02
GAU, TSAI-SHENG
Executed: 2011-06-02
Assignee
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
NO. 8, LI-HSIN RD. 6, SCIENCE-BASED INDUSTRIAL PARK, HSIN-CHU, 300-77, TAIWAN
Covered Property
(1)
Extraction of Systematic Defects Using an Inspection Window with Greater Sensitivity Than Outside the Window