Assignment of Assignor's Interest

Recorded: 2011-09-19 Pages: 2

Assignor

BAN, MASAFUMI

Executed: 2011-08-18

Assignee

OKI SEMICONDUCTOR CO., LTD.

550-1, HIGASHIASAKAWA-CHO, HACHIOUJI-SHI, TOKYO, 193-8550, JAPAN

Covered Property (1)

Semiconductor Device, and Method of Diagnosing Abnormality of Boosting Circuit of Semiconductor Device

Patent: 8,508,279 →

Application: 13/236,270 →

Publication: US 2012/0081167

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.