Patent Assignment
Reel/Frame 027153/0413
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded: 2011-11-01
Received: 2011-11-01
Pages: 3
Assignor
TERUI, SATORU
Executed: 2011-10-20
Assignee
ELPIDA MEMORY, INC.
2-1, YAESU 2-CHOME, CHUO-KU, TOKYO, JPX, JAPAN
Covered Application
(1)
WAFER TEST APPARATUS, WAFER TEST METHOD, AND PROGRAM
App. No. 13/284,313
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