IP Library Assignment 027269/0465
Patent Assignment
Reel/Frame 027269/0465

Assignment of Assignor's Interest

Recorded: 2011-11-22 Pages: 3
Assignors
RIHO, YOSHIRO
Executed: 2011-09-29
NODA, HIROMASA
Executed: 2011-09-29
SAKUMA, KAZUKI
Executed: 2011-09-29
Assignee
ELPIDA MEMORY, INC.
2-1, YAESU 2-CHOME, CHUO-KU,, TOKYO, JAPAN
Covered Property (1)
Semiconductor Device Performing Stress Test
Patent: 8,737,149 →
Application: 13/302,772 →
Publication: US 2012/0127814
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest May 15, 2014
From: ELPIDA MEMORY, INC.
To: PS4 LUXCO S.A.R.L.
Reel/Frame 032899/0588 →
Change of Name Aug 24, 2016
From: PS5 LUXCO S.A.R.L.
To: LONGITUDE SEMICONDUCTOR S.A.R.L.
Reel/Frame 039793/0880 →
Assignment of Assignor's Interest Aug 24, 2016
From: PS4 LUXCO S.A.R.L.
To: PS5 LUXCO S.A.R.L.
Reel/Frame 039818/0506 →
Assignment of Assignor's Interest Aug 21, 2018
From: LONGITUDE SEMICONDUCTOR S.A.R.L.
To: LONGITUDE LICENSING LIMITED
Reel/Frame 046865/0667 →