Patent Assignment
Reel/Frame 027613/0504
Assignment of Assignor's Interest
Recorded: 2012-01-30
Pages: 2
Assignor
SUZUKI, TOSHIKAZU
Executed: 2011-11-09
Assignee
PANASONIC CORPORATION
1006 OAZA KADOMA, KADOMA-SHI, OSAKA, 571-8501, JAPAN
Covered Property
(1)
Semiconductor Integrated Circuit Having a Test Function for Detecting a Defective Cell.
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.