Patent Assignment
Reel/Frame 028291/0864
Assignment of Assignor's Interest
Recorded: 2012-05-30
Received: 2012-05-30
Pages: 2
Assignor
KODAMA, TAKUYO
Executed: 2012-05-14
Assignee
ELPIDA MEMORY, INC.
2-1, YAESU 2-CHOME, CHUO-KU, TOKYO, JPX, 104-0028, JAPAN
Covered Properties
(3)
Reference Architecture For Improved Scalability Of Virtual Data Center Resources
Application:
13/483,916 →
Semiconductor Device on Which Wafer-Level Burn-in Test Is Performed and Manufacturing Method Thereof
Application:
13/483,439 →
Housing for Receiving a Bearing Component and Process for Manufacturing Same
Application:
10/808,026 →