Patent Assignment
Reel/Frame 028389/0366
Assignment of Assignor's Interest
Recorded: 2012-06-18
Pages: 3
Assignors
CHANG, MIN-CHIH
Executed: 2012-03-26
WANG, SHIH-HSING
Executed: 2012-03-26
YU, TE-YI
Executed: 2012-03-26
YANG, LIEN-SHENG
Executed: 2012-03-26
Assignee
ETRON TECHNOLOGY, INC.
NO. 6, TECHNOLOGY ROAD 5, HSINCHU, TAIWAN
Covered Property
(1)
Method of Detecting Connection Defects of Memory and Memory Capable of Detecting Connection Defects thereof