Patent Assignment
Reel/Frame 028878/0456
Assignment of Assignor's Interest
Recorded: 2012-08-30
Pages: 2
Assignor
KIM, CHANG KIL
Executed: 2012-08-24
Assignee
SK HYNIX INC.
2091, GYEONGCHUNG-DAERO, BUBAL-EUB, ICHEON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF
Covered Property
(1)
Test Pattern of Semiconductor Device, Method of Manufacturing Test Pattern and Method of Testing Semiconductor Device by Using Test Pattern
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.