Patent Assignment
Reel/Frame 029284/0184
Assignment of Assignor's Interest
Recorded: 2012-11-13
Pages: 2
Assignor
TAKASO, JUN
Executed: 2012-08-01
Assignee
MITSUBISHI ELECTRIC CORPORATION
7-3, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO, 100-8310, JAPAN
Covered Property
(1)
Method for Testing Semiconductor Wafer
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.