IP Library › Assignment 029508/0496
Patent Assignment
Reel/Frame 029508/0496

Assignment of Assignor's Interest

Recorded: 2012-12-20 Pages: 3
Assignor
ABE, ICHIRO
Executed: 2012-12-04
Assignee
ELPIDA MEMORY, INC.
2-1, YAESU 2-CHOME, CHUO-KU, TOKYO, JAPAN
Covered Property (1)
Semiconductor Device Having Test Circuit That Synthesizes Test Data Based on Error Data
Application: 13/720,332 →
Publication: US 2013/0173973
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Security Agreement Jul 29, 2013
From: PS4 LUXCO S.A.R.L.
To: ELPIDA MEMORY INC.
Reel/Frame 032414/0261 →
Assignment of Assignor's Interest May 15, 2014
From: ELPIDA MEMORY, INC.
To: PS4 LUXCO S.A.R.L.
Reel/Frame 032899/0196 →