IP Library Assignment 029890/0687
Patent Assignment
Reel/Frame 029890/0687

Assignment of Assignor's Interest

Recorded: 2013-02-27 Pages: 3
Assignor
DEN BOEF, ARIE JEFFREY
Executed: 2008-08-27
Assignee
ASML NETHERLANDS B.V.
DE RUN 6501, VELDHOVEN, NL - 5504 DR, NETHERLANDS
Covered Property (1)
Diffraction Based Overlay Metrology Tool and Method of Diffraction Based Overlay Metrology
Patent: 8,670,118 →
Application: 13/676,562 →
Publication: US 2013/0155406