IP Library Assignment 030983/0051
Patent Assignment
Reel/Frame 030983/0051

Assignment of Assignor's Interest

Recorded: 2013-07-30 Pages: 5
Assignors
YAMANAKA, HITOSHI
Executed: 2013-06-24
GOMI, KENICHI
Executed: 2013-06-21
Assignees
FUJITSU LIMITED
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA 211-8588, JAPAN
FUJITSU SEMICONDUCTOR LIMITED
2-10-23 SHIN-YOKOHAMA, KOHOKU-KU, YOKOHAMA-SHI, KANAGAWA 222-0033, JAPAN
Covered Property (1)
Semiconductor Device and Memory Test Method
Application: 13/949,902 →
Publication: US 2014/0068193
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Apr 23, 2015
From: FUJITSU LIMITED; FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU LIMITED; SOCIONEXT INC.
Reel/Frame 035481/0271 →