IP Library › Assignment 031233/0410
Patent Assignment
Reel/Frame 031233/0410

Assignment of Assignor's Interest

Recorded: 2013-09-18 Pages: 4
Assignors
KOMUTA, NAOYUKI
Executed: 2013-06-20
FUKUDA, MASATOSHI
Executed: 2013-06-20
Assignee
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, 105-8001, JAPAN
Covered Property (1)
Inspection Apparatus and Inspection Method for Semiconductor Device
Patent: 9,052,187 →
Application: 13/784,334 →
Publication: US 2013/0250298
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jul 14, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043194/0647 →
Merger Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
Change of Name and Address Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
Change of Name and Address Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →