IP Library › Assignment 031761/0987
Patent Assignment
Reel/Frame 031761/0987

Assignment of Assignor's Interest

Recorded: 2013-12-11 Pages: 8
Assignors
OKUTSU, AKIHIKO
Executed: 2013-11-21
SAITO, HITOSHI
Executed: 2013-11-26
OKANO, YOSHIAKI
Executed: 2013-11-30
Assignee
FUJITSU SEMICONDUCTOR LIMITED
2-10-23 SHIN-YOKOHAMA, KOHOKU-KU, YOKOHAMA-SHI, KANAGAWA, 222-0033, JAPAN
Covered Property (1)
Semiconductor Device and Test Method
Patent: 9,081,050 →
Application: 14/103,310 →
Publication: US 2014/0097861
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Address Dec 23, 2016
From: FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 041188/0401 →
Assignment of Assignor's Interest Jul 13, 2020
From: FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU SEMICONDUCTOR MEMORY SOLUTION LIMITED
Reel/Frame 053195/0249 →