IP Library › Assignment 031895/0548
Patent Assignment
Reel/Frame 031895/0548

Assignment of Assignor's Interest

Recorded: 2014-01-06 Pages: 2
Assignors
NIU, XINHUI
Executed: 2001-06-25
JAKATDAR, NICKHIL
Executed: 2001-06-25
Assignee
TIMBRE TECHNOLOGIES, INC.
5341 RANDALL PLACE, FREMONT, CALIFORNIA, 94538
Covered Property (1)
Grating Test Patterns and Methods for Overlay Metrology
Patent: 6,855,464 →
Application: 10/739,660 →
Publication: US 2004/0137341
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Merger Jan 6, 2014
From: TEL TIMBRE TECHNOLOGIES, INC.
To: TOKYO ELECTRON AMERICA, INC.
Reel/Frame 031896/0231 →
Change of Name Jan 6, 2014
From: TIMBRE TECHNOLOGIES, INC.
To: TEL TIMBRE TECHNOLOGIES, INC.
Reel/Frame 031924/0275 →