IP Library Assignment 032782/0765
Patent Assignment
Reel/Frame 032782/0765

Assignment of Assignor's Interest

Recorded: 2014-04-29 Pages: 4
Assignors
MATSUO, YUKIKAZU
Executed: 2014-03-24
TANAKA, YASUYUKI
Executed: 2014-03-24
SUGIMOTO, MASARU
Executed: 2014-03-24
NOBUNAGA, KYOSAKU
Executed: 2014-03-24
Assignee
RENESAS ELECTRONICS CORPORATION
NAKANOSHIMA CENTRAL TOWER, 22ND FLOOR, 1753, SHIMONUMABE, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA, 211-8668, JAPAN
Covered Property (1)
Semiconductor Test Apparatus for Controlling Tester
Patent: 9,811,450 →
Application: 14/265,068 →
Publication: US 2014/0325191
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Corrective Assignment to Correct the Assignee's Address Previously Recorded at Reel: 067161 Frame: 0652. Assignor(S) Hereby Confirms the Assignment. Oct 2, 2015
From: MATSUO, YUKIKAZU; TANAKA, YASUYUKI; SUGIMOTO, MASARU; NOBUNAGA, KYOSAKU
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 036746/0455 →
Change of Address of Assignee Jun 1, 2018
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 045984/0759 →