Assignment of Assignor's Interest

Recorded: 2014-07-09 Pages: 4

Assignors

SATO, YASUO

Executed: 2014-06-29

KAJIHARA, SEIJI

Executed: 2014-07-02

Assignee

KYUSHU INSTITUTE OF TECHNOLOGY

1-1, SENSUI-CHO, TOBATA-KU, KITAKYUSHU-SHI, FUKUOKA, 804-8550, JAPAN

Covered Property (1)

Test Pattern Generation Device, Fault Detection System, Test Pattern Generation Method, Program and Recording Medium

Patent: 9,702,927 →

Application: 14/371,317 →

Publication: US 2015/0006102

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.