Assignment of Assignor's Interest

Recorded: 2014-11-21 Pages: 4

Assignors

OSANAI, YOSUKE

Executed: 2014-10-29

USHIJIMA, TAKASHI

Executed: 2014-10-29

Assignee

TOYOTA JIDOSHA KABUSHIKI KAISHA

1, TOYOTA-CHO, TOYOTA-SHI, AICHI-KEN, 4718571, JAPAN

Covered Property (1)

Inspection Apparatus, Inspection System, Inspection Method of Semiconductor Devices, and Manufacturing Method of Inspected Semiconductor Devices

Patent: 9,379,029 →

Application: 14/402,951 →

Publication: US 2015/0123694

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.