IP Library Assignment 034496/0602
Patent Assignment
Reel/Frame 034496/0602

Assignment of Assignor's Interest

Recorded: 2014-11-28 Pages: 3
Assignors
KU, KIE-BONG
Executed: 2014-11-27
LEE, LEE-BUM
Executed: 2014-11-27
Assignee
SK HYNIX INC.
2091, GYEONGCHUNG-DAERO, BUBAL-EUB, ICHEON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF
Covered Property (1)
Method and System for Testing Semiconductor Device
Patent: 9,274,162 →
Application: 14/556,019 →
Publication: US 2015/0084665
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest May 7, 2024
From: SK HYNIX INC.
To: MIMIRIP LLC
Reel/Frame 067335/0246 →