Assignment of Assignor's Interest

Recorded: 2015-01-09 Pages: 3

Assignors

TAKANO, YUUSUKE

Executed: 2014-10-10

GOTO, YOSHIAKI

Executed: 2014-10-10

WATANABE, TAKESHI

Executed: 2014-10-10

IMOTO, TAKASHI

Executed: 2014-10-17

Assignee

KABUSHIKI KAISHA TOSHIBA

1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, 105-8001, JAPAN

Covered Property (1)

Semiconductor Device and Method of Inspecting the Same

Application: 14/474,635 →

Publication: US 2015/0070046

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.