Patent Assignment
Reel/Frame 034994/0853
Assignment of Assignor's Interest
Recorded: 2015-02-20
Pages: 3
Assignor
SETO, MOTOSHI
Executed: 2014-11-18
Assignee
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, 105-8001, JAPAN
Covered Property
(1)
Testing Apparatus and Method for Testing Semiconductor Chips
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.