IP Library Assignment 035325/0389
Patent Assignment
Reel/Frame 035325/0389

Assignment of Assignor's Interest

Recorded: 2015-04-02 Pages: 10
Assignors
TSUBOI, YUKITOSHI
Executed: 2015-03-10
NAGANO, HIDEO
Executed: 2015-03-10
NAGAOKA, HIROSHI
Executed: 2015-03-10
MATSUNAGA, YUSUKE
Executed: 2015-03-10
IGAKU, YUTAKA
Executed: 2015-03-10
KUBOTA, NAOTAKA
Executed: 2015-03-10
Assignee
RENESAS ELECTRONICS CORPORATION
1753, SHIMONUMABE, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA, 211-8668, JAPAN
Covered Property (1)
Semiconductor Device, Diagnostic Test, and Diagnostic Test Circuit
Patent: 9,810,738 →
Application: 14/676,743 →
Publication: US 2015/0293173
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Address Dec 18, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 045764/0902 →