Patent Assignment
Reel/Frame 035447/0700
Assignment of Assignor's Interest
Recorded: 2015-04-20
Pages: 5
Assignors
HWANG, SEOKJOONG
Executed: 2015-04-08
SHIN, YOUNGSAM
Executed: 2015-04-08
LEE, WONJONG
Executed: 2015-04-08
LEE, JAEDON
Executed: 2015-04-08
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, GYEONGGI-DO, SUWON-SI, 443-742, KOREA, REPUBLIC OF
Covered Property
(1)
Method and Apparatus for Performing Ray-Node Intersection Test