Patent Assignment
Reel/Frame 035627/0614
Assignment of Assignor's Interest
Recorded: 2015-05-13
Pages: 7
Assignors
LEE, HYUNG-JOO
Executed: 2015-04-01
PARK, WON-JOO
Executed: 2015-04-01
CHOI, SEUK-HWAN
Executed: 2015-04-01
KIM, BYUNG-GOOK
Executed: 2015-04-01
CHUNG, DONG-HOON
Executed: 2015-04-01
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 443-742, KOREA, REPUBLIC OF
Covered Property
(1)
Method for Grouping Region of Interest of Mask Pattern and Measuring Critical Dimension of Mask Pattern Using the Same