Patent Assignment
Reel/Frame 035764/0205
Assignment of Assignor's Interest
Recorded: 2015-06-02
Pages: 2
Assignor
NAKAMURA, TOMONORI
Executed: 2015-05-12
Assignee
HAMAMATSU PHOTONICS K.K.
1126-1, ICHINO-CHO, HIGASHI-KU, HAMAMATSU-SHI, SHIZUOKA, 435-8558, JAPAN
Covered Property
(1)
Semiconductor Device Inspection Device and Semiconductor Device Inspection Method