IP Library › Assignment 036611/0982
Patent Assignment
Reel/Frame 036611/0982

Assignment of Assignor's Interest

Recorded: 2015-09-21 Pages: 3
Assignors
MURATA, MICHIHIRO
Executed: 2015-09-19
GOMI, YUTAKA
Executed: 2015-09-19
Assignee
SEIKO INSTRUMENTS INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property (1)
Reticle Transmittance Measurement Method, and Projection Exposure Method Using the Same
Patent: 9,733,567 →
Application: 14/859,781 →
Publication: US 2016/0091391
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Mar 10, 2016
From: SEIKO INSTRUMENTS INC.
To: SII SEMICONDUCTOR CORPORATION
Reel/Frame 038058/0892 →
Change of Name Mar 12, 2018
From: SII SEMICONDUCTOR CORPORATION
To: ABLIC INC.
Reel/Frame 045567/0927 →
Change of Address Jun 8, 2023
From: ABLIC INC.
To: ABLIC INC.
Reel/Frame 064021/0575 →