Patent Assignment
Reel/Frame 036767/0536
Nunc Pro Tunc Assignment
Recorded: 2015-10-09
Pages: 14
Assignors
YUN, WENBING
Executed: 2015-09-23
LEWIS, SYLVIA JIA YUN
Executed: 2015-09-23
KIRZ, JANOS
Executed: 2015-09-23
Assignee
SIGRAY, INC.
5750 IMHOFF DR., SUITE I, CONCORD, CALIFORNIA, 94520
Covered Properties
(2)
X-Ray Method for Measurement, Characterization, and Analysis of Periodic Structures
PCT:
PCT/US2015/031223 ↗
X-Ray Method for the Measurement, Characterization, and Analysis of Periodic Structures