Patent Assignment
Reel/Frame 036767/0747
Assignment of Assignor's Interest
Recorded: 2015-10-09
Pages: 2
Assignor
AIYER, ARUN ANANTH
Executed: 2014-04-18
Assignee
APPLEJACK 199 L.P.
2127 RINGWOOD AVENUE, SAN JOSE, CALIFORNIA, 95131
Covered Property
(1)
Method and System for Measuring Patterned Substrates